AZOM

Accelerating Multi-Modal Materials Characterization with Plasma FIB-SEM

In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...
AZOM

Fabrication of Ga-Free Microstructures with Xe Plasma FIB

In the fields of electronics and nanotechnology the ability to manipulate materials at the nanoscale is paramount. Focused ion beam (FIB) instruments have become essential for this work. FIB works in ...
AZoNano

Nanofluidic Devices for DNA Optical Mapping can be Fabricated and Characterized with FIB-SEM

Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...
Nanowerk

Focused Ion Beam Milling: Precision Nanofabrication at the Nanoscale

What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...
Electronic Design

FIB Circuit Edit Becomes Increasingly Valuable In Advanced Node Design

A technique used on older process nodes is providing even more valuable benefits as IC designers work on devices that will be manufactured at advanced technology nodes including 28 nm and beyond. Now ...