Researchers from the labs of Professors Vinayak Dravid and Omar Farha developed a high-resolution approach to map ...

Scanning Electron Microscopy (SEM) remains an indispensable tool for visualising material surfaces at the nanometre scale. The technique relies on a focused electron beam to generate high-resolution ...

The technique of dopant profiling using scanning electron microscopy (SEM) has emerged as a vital tool in semiconductor research, enabling rapid, contactless and high‐resolution analysis of dopant ...

This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

Among all the instruments in its class, the Thermo Scientific Prisma E Scanning Electron Microscope (SEM) offers the most comprehensive solution, thanks to its sophisticated automation and extensive ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

Coatings are required to remove or diminish the electrical charges that promptly accumulate in a nonconducting material when examined by a high-energy electron beam. Material samples investigated at ...

Thin section petrography, geochemistry, scanning electron microscopy and X-ray diffraction are key scientific methods used to investigate the raw materials, origins and production technology of ...

STEM operates by focusing a beam of electrons into a narrow probe that is scanned across a thin specimen. As the electrons interact with the sample, they are either scattered or transmitted. The ...